Defect Identification with Positrons |
| Journal |
Materials Science Forum (Volumes 363 - 365) |
| Volume |
Positron Annihilation - ICPA-12 |
| Edited by |
Werner Triftshäuser, Gottfried Kögel and Peter Sperr |
| Pages |
25-29 |
| DOI |
10.4028/www.scientific.net/MSF.363-365.25 |
| Citation |
C.D. Beling et al., 2001, Materials Science Forum, 363-365, 25 |
| Authors |
C.D. Beling, S. Fung |
| Keywords |
6H-SiC, Deep-Level Transient Spectroscopy, Doppler Broadening Spectroscopy, Double Doppler Broadening Spectroscopy, Lifetime Spectroscopy, Positron Deep Level Transient Spectroscopy, α-Si:H |
| Full Paper |
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