Paper Title:
Bulk Studies of Defects in Semiconductors
  Abstract

  Info
Periodical
Materials Science Forum (Volumes 363-365)
Edited by
Werner Triftshäuser, Gottfried Kögel and Peter Sperr
Pages
30-34
DOI
10.4028/www.scientific.net/MSF.363-365.30
Citation
P. Mascher, "Bulk Studies of Defects in Semiconductors", Materials Science Forum, Vols. 363-365, pp. 30-34, 2001
Online since
April 2001
Authors
Export
Price
$32.00
Share

In order to see related information, you need to Login.

In order to see related information, you need to Login.