Bulk Studies of Defects in Semiconductors |
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| Journal | Materials Science Forum (Volumes 363 - 365) |
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| Volume | Positron Annihilation - ICPA-12 |
| Edited by | Werner Triftshäuser, Gottfried Kögel and Peter Sperr |
| Pages | 30-34 |
| DOI | 10.4028/www.scientific.net/MSF.363-365.30 |
| Authors | Peter Mascher |
| Keywords | Cd1-xZnxTe (CZT), Crystallization, Positron Lifetime, β-Ga2O3 |
| Full Paper | 
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