Paper Title:
GaN Thin Films on SiC Substrates Studied Using Variable Energy Positron Annihilation Spectroscopy
  Abstract

  Info
Periodical
Materials Science Forum (Volumes 363-365)
Edited by
Werner Triftshäuser, Gottfried Kögel and Peter Sperr
Pages
478-480
DOI
10.4028/www.scientific.net/MSF.363-365.478
Citation
Y.F. Hu, Y.Y. Shan, C.D. Beling, S. Fung, M.H. Xie, S.H. Cheung, J. Tu, G. Brauer, W. Anwand, D.S.Y. Tong, "GaN Thin Films on SiC Substrates Studied Using Variable Energy Positron Annihilation Spectroscopy", Materials Science Forum, Vols. 363-365, pp. 478-480, 2001
Online since
April 2001
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