Paper Title:
Defect Studies in Semiconductors
  Abstract

  Info
Periodical
Materials Science Forum (Volumes 363-365)
Edited by
Werner Triftshäuser, Gottfried Kögel and Peter Sperr
Pages
52-55
DOI
10.4028/www.scientific.net/MSF.363-365.52
Citation
M. Fujinami, T. Sawada, T. Akahane, "Defect Studies in Semiconductors", Materials Science Forum, Vols. 363-365, pp. 52-55, 2001
Online since
April 2001
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Price
$32.00
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