Paper Title:
Interface Defects of Al/GaAs(100) Detected by Positron Annihilation Induced Auger Electron Spectroscopy (PAES)
  Abstract

  Info
Periodical
Materials Science Forum (Volumes 363-365)
Edited by
Werner Triftshäuser, Gottfried Kögel and Peter Sperr
Pages
621-623
DOI
10.4028/www.scientific.net/MSF.363-365.621
Citation
W.C. Chen, N.G. Fazleev, J.L. Fry, A. H. Weiss, "Interface Defects of Al/GaAs(100) Detected by Positron Annihilation Induced Auger Electron Spectroscopy (PAES)", Materials Science Forum, Vols. 363-365, pp. 621-623, 2001
Online since
April 2001
Export
Price
$32.00
Share

In order to see related information, you need to Login.

In order to see related information, you need to Login.