Native and Irradiation-Induced Defects in SiO2 Structures Studied by Positron Annihilation Techniques |
| Journal |
Materials Science Forum (Volumes 363 - 365) |
| Volume |
Positron Annihilation - ICPA-12 |
| Edited by |
Werner Triftshäuser, Gottfried Kögel and Peter Sperr |
| Pages |
64-66 |
| DOI |
10.4028/www.scientific.net/MSF.363-365.64 |
| Citation |
A. Rivera et al., 2001, Materials Science Forum, 363-365, 64 |
| Authors |
A. Rivera, I. Montilla, A. Alba García, R. Escobar-Galindo, C.V. Falub, A. van Veen, H. Schut, J.M.M. de Nijs, P. Balk |
| Keywords |
2D-ACAR, Deuterium Implantation, Doppler Broadening, Positron Lifetime, Positronium, SIMOX, SOI |
| Full Paper |
Get the full paper by clicking here
|
