Paper Title:
Native and Irradiation-Induced Defects in SiO2 Structures Studied by Positron Annihilation Techniques
  Abstract

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Periodical
Materials Science Forum (Volumes 363-365)
Edited by
Werner Triftshäuser, Gottfried Kögel and Peter Sperr
Pages
64-66
DOI
10.4028/www.scientific.net/MSF.363-365.64
Citation
A. Rivera, I. Montilla, A. Alba García, R. Escobar Galindo, C.V. Falub, A. van Veen, H. Schut, J.M.M. de Nijs, P. Balk, "Native and Irradiation-Induced Defects in SiO2 Structures Studied by Positron Annihilation Techniques", Materials Science Forum, Vols. 363-365, pp. 64-66, 2001
Online since
April 2001
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