Identification of Vacancies on each Sublattice of SiC by Coincident Doppler Broadening of the Positron Annihilation Photons after Electron Irradiation |
| Journal |
Materials Science Forum (Volumes 363 - 365) |
| Volume |
Positron Annihilation - ICPA-12 |
| Edited by |
Werner Triftshäuser, Gottfried Kögel and Peter Sperr |
| Pages |
70-72 |
| DOI |
10.4028/www.scientific.net/MSF.363-365.70 |
| Citation |
M.A. Müller et al., 2001, Materials Science Forum, 363-365, 70 |
| Authors |
M.A. Müller, Al. Rempel, K.J. Reichle, W. Sprengel, J. Major, Hans Eckhardt Schaefer |
| Keywords |
Coincident Doppler Broadening, Lattice Vacancy, Positron Annihilation, Silicon Carbide (SiC) |
| Full Paper |
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