Paper Title:
Identification of Vacancies on each Sublattice of SiC by Coincident Doppler Broadening of the Positron Annihilation Photons after Electron Irradiation
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Periodical
Materials Science Forum (Volumes 363-365)
Edited by
Werner Triftshäuser, Gottfried Kögel and Peter Sperr
Pages
70-72
DOI
10.4028/www.scientific.net/MSF.363-365.70
Citation
M.A. Müller, A. Rempel, K.J. Reichle, W. Sprengel, J. Major, H. E. Schaefer, "Identification of Vacancies on each Sublattice of SiC by Coincident Doppler Broadening of the Positron Annihilation Photons after Electron Irradiation", Materials Science Forum, Vols. 363-365, pp. 70-72, 2001
Online since
April 2001
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