Paper Title:
Detailed Microscopic Defect Identification in GaAs
  Abstract

  Info
Periodical
Materials Science Forum (Volumes 363-365)
Edited by
Werner Triftshäuser, Gottfried Kögel and Peter Sperr
Pages
76-78
DOI
10.4028/www.scientific.net/MSF.363-365.76
Citation
J. Gebauer, T.E.M. Staab, F. Redmann, R. Krause-Rehberg, "Detailed Microscopic Defect Identification in GaAs", Materials Science Forum, Vols. 363-365, pp. 76-78, 2001
Online since
April 2001
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Price
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