Paper Title:
Interfaces of Fe/Si Multilayered Films Analysed by Optical Spectroscopy
  Abstract

  Info
Periodical
Materials Science Forum (Volumes 373-376)
Main Theme
Edited by
V.G. Baryakhtar
Pages
161-164
DOI
10.4028/www.scientific.net/MSF.373-376.161
Citation
Y.V. Kudryavtsev, Y.P. Lee, K.W. Kim, J.Y. Rhee, J. Dubowik, B. Szymanski, F. Stobiecki, "Interfaces of Fe/Si Multilayered Films Analysed by Optical Spectroscopy", Materials Science Forum, Vols. 373-376, pp. 161-164, 2001
Online since
August 2001
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Price
$32.00
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