Fundamental Parameters Versus Learnt Profiles Using the Rietveld Program BGMN |
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| Journal | Materials Science Forum (Volumes 378 - 381) |
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| Volume | European Powder Diffraction EPDIC 7 |
| Edited by | R. Delhez and E.J. Mittemeijer |
| Pages | 30-37 |
| DOI | 10.4028/www.scientific.net/MSF.378-381.30 |
| Authors | J. Bergmann, R. Kleeberg |
| Keywords | Line Profile Analysis, Rietveld, Size-Strain Analysis, X-Ray Diffraction (XRD) |
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