Paper Title:
X-Ray Diffraction Study of Cu25[AsSe1.4I0.2]75 Amorphous Semiconductor
  Abstract

  Info
Periodical
Materials Science Forum (Volumes 378-381)
Edited by
R. Delhez and E.J. Mittemeijer
Pages
394-401
DOI
10.4028/www.scientific.net/MSF.378-381.394
Citation
Á. Bordás, M. Vučinić, A. Kapor, B. Antić, "X-Ray Diffraction Study of Cu25[AsSe1.4I0.2]75 Amorphous Semiconductor", Materials Science Forum, Vols. 378-381, pp. 394-401, 2001
Online since
October 2001
Export
Price
$32.00
Share

In order to see related information, you need to Login.

In order to see related information, you need to Login.