Paper Title:
X-Ray Line Profile Analysis of Nanodisperse Silicon Nitride Ceramics
  Abstract

  Info
Periodical
Materials Science Forum (Volumes 378-381)
Edited by
R. Delhez and E.J. Mittemeijer
Pages
729-734
DOI
10.4028/www.scientific.net/MSF.378-381.729
Citation
J. Gubicza, J. Szépvölgyi, I. Mohai, T. Ungár, "X-Ray Line Profile Analysis of Nanodisperse Silicon Nitride Ceramics", Materials Science Forum, Vols. 378-381, pp. 729-734, 2001
Online since
October 2001
Export
Price
$32.00
Share

In order to see related information, you need to Login.

In order to see related information, you need to Login.