X-Ray Line Profile Analysis of Nanodisperse Silicon Nitride Ceramics |
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| Journal | Materials Science Forum (Volumes 378 - 381) |
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| Volume | European Powder Diffraction EPDIC 7 |
| Edited by | R. Delhez and E.J. Mittemeijer |
| Pages | 729-734 |
| DOI | 10.4028/www.scientific.net/MSF.378-381.729 |
| Citation | Jenő Gubicza et al., 2001, Materials Science Forum, 378-381, 729 |
| Authors | Jenő Gubicza, J. Szépvölgyi, I. Mohai, Tamás Ungár |
| Keywords | Grain Size Distribution, Nanodisperse Silicon Nitride, X-Ray Diffraction Profile Analysis |
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