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Stacking Disorder in Aurivillius Compounds Studied by X-Ray Diffraction Line Profile Analysis

Journal Materials Science Forum (Volumes 378 - 381)
Volume European Powder Diffraction EPDIC 7
Edited by R. Delhez and E.J. Mittemeijer
Pages 753-758
DOI 10.4028/www.scientific.net/MSF.378-381.753
Citation Alexandre Boulle et al., 2001, Materials Science Forum, 378-381, 753
Authors Alexandre Boulle, C. Legrand, P. Thomas, R. Guinebretière, J.P. Mercurio, A. Dauger
Keywords Aurivillius Phase, Line Profile Analysis, X-Ray Diffraction (XRD)
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