Paper Title:
Applications of Mössbauer Spectroscopy to Investigations of Defects in Semiconductors
  Abstract

  Info
Periodical
Materials Science Forum (Volumes 38-41)
Edited by
G. Ferenczi
Pages
1137-1144
DOI
10.4028/www.scientific.net/MSF.38-41.1137
Citation
A. Nylandsted-Larsen, J.W. Petersen, G. Weyer, "Applications of Mössbauer Spectroscopy to Investigations of Defects in Semiconductors", Materials Science Forum, Vols. 38-41, pp. 1137-1144, 1989
Online since
January 1991
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