Paper Title:
Characterization of Deep Defects in Semi-Insulating GaAs by Capacitance and Conductance DLTS with Electrical and Optical Excitations
  Abstract

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Periodical
Materials Science Forum (Volumes 38-41)
Edited by
G. Ferenczi
Pages
1301-1306
DOI
10.4028/www.scientific.net/MSF.38-41.1301
Citation
F. Dubecky, "Characterization of Deep Defects in Semi-Insulating GaAs by Capacitance and Conductance DLTS with Electrical and Optical Excitations", Materials Science Forum, Vols. 38-41, pp. 1301-1306, 1989
Online since
January 1991
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Price
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