Paper Title:
Defect Alalysis in Semiconductors by Dechanneling
  Abstract

  Info
Periodical
Materials Science Forum (Volumes 38-41)
Edited by
G. Ferenczi
Pages
1307-1312
DOI
10.4028/www.scientific.net/MSF.38-41.1307
Citation
K. Gärtner, W. Wesch, A. Jordanow, "Defect Alalysis in Semiconductors by Dechanneling", Materials Science Forum, Vols. 38-41, pp. 1307-1312, 1989
Online since
January 1991
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Price
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