Paper Title:
Photoluminescence and Transmision Electron Microscopy of Defects in SiC Grown on Si
  Abstract

  Info
Periodical
Materials Science Forum (Volumes 38-41)
Edited by
G. Ferenczi
Pages
1433-1438
DOI
10.4028/www.scientific.net/MSF.38-41.1433
Citation
W. J. Choyke, J. A. Powell, T.T. Cheng, P. Pirouz, "Photoluminescence and Transmision Electron Microscopy of Defects in SiC Grown on Si", Materials Science Forum, Vols. 38-41, pp. 1433-1438, 1989
Online since
January 1991
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Price
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