Paper Title:
Influence of the Defect Density of Amorphous Silicon at the Substrate Interface on the Schottky Barrier Characteristics
  Abstract

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Periodical
Materials Science Forum (Volumes 38-41)
Edited by
G. Ferenczi
Pages
1481-1486
DOI
10.4028/www.scientific.net/MSF.38-41.1481
Citation
J.C. van den Heuvel, R.C. van Oort, M.J. Geerts, B. Bokhorst, J.W. Metselaar, "Influence of the Defect Density of Amorphous Silicon at the Substrate Interface on the Schottky Barrier Characteristics", Materials Science Forum, Vols. 38-41, pp. 1481-1486, 1989
Online since
January 1991
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