Paper Title:
Microinhomogeneities Characterized by Photocurrent Measurements and the Sem-Ebic Technique in Alpha-Si:H Layers
  Abstract

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Periodical
Materials Science Forum (Volumes 38-41)
Edited by
G. Ferenczi
Pages
1487-0
DOI
10.4028/www.scientific.net/MSF.38-41.1487
Citation
M. Füstöss-Wegner, L. Pogány, M. Koós, L. S. Tóth, G. Zentai, "Microinhomogeneities Characterized by Photocurrent Measurements and the Sem-Ebic Technique in Alpha-Si:H Layers ", Materials Science Forum, Vols. 38-41, pp. 1487-0, 1989
Online since
January 1991
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Price
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