Paper Title:
Electronic Characterization of Defects in Iron-Doped P-Type Silicon
  Abstract

  Info
Periodical
Materials Science Forum (Volumes 38-41)
Edited by
G. Ferenczi
Pages
373-378
DOI
10.4028/www.scientific.net/MSF.38-41.373
Citation
W. Gehlhoff, K. Irmscher, U. Rehse, "Electronic Characterization of Defects in Iron-Doped P-Type Silicon", Materials Science Forum, Vols. 38-41, pp. 373-378, 1989
Online since
January 1991
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Price
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