Paper Title:
Tin Related Defect in Electron Irradiated n-Type Silicon Studied by DLTS
  Abstract

  Info
Periodical
Materials Science Forum (Volumes 38-41)
Edited by
G. Ferenczi
Pages
439-444
DOI
10.4028/www.scientific.net/MSF.38-41.439
Citation
J. Nielsen, K. B. Nielsen, A. N. Larsen, "Tin Related Defect in Electron Irradiated n-Type Silicon Studied by DLTS", Materials Science Forum, Vols. 38-41, pp. 439-444, 1989
Online since
January 1991
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Price
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