Paper Title:
On Shallow Interface States in n-Type 4H-SiC Metal-Oxide-Semiconductor Structures
  Abstract

  Info
Periodical
Materials Science Forum (Volumes 389-393)
Edited by
S. Yoshida, S. Nishino, H. Harima and T. Kimoto
Pages
1005-1008
DOI
10.4028/www.scientific.net/MSF.389-393.1005
Citation
H.Ö. Ólafsson, F. Allerstam, E. Ö. Sveinbjörnsson, "On Shallow Interface States in n-Type 4H-SiC Metal-Oxide-Semiconductor Structures", Materials Science Forum, Vols. 389-393, pp. 1005-1008, 2002
Online since
April 2002
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Price
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