Paper Title:
The Investigation of 4H-SiC/SiO2 Interfaces by Optical and Electrical Measurements
  Abstract

  Info
Periodical
Materials Science Forum (Volumes 389-393)
Edited by
S. Yoshida, S. Nishino, H. Harima and T. Kimoto
Pages
1013-1016
DOI
10.4028/www.scientific.net/MSF.389-393.1013
Citation
Y. Ishida, T. Takahashi, H. Okumura, T. Jikimoto, H. Tsuchida, M. Yoshikawa, Y. Tomioka, M. Midorikawa, Y. Hijikata, S. Yoshida, "The Investigation of 4H-SiC/SiO2 Interfaces by Optical and Electrical Measurements", Materials Science Forum, Vols. 389-393, pp. 1013-1016, 2002
Online since
April 2002
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Price
$32.00
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