Paper Title:
Impact of Material Defects on SiC Schottky Barrier Diodes
  Abstract

  Info
Periodical
Materials Science Forum (Volumes 389-393)
Edited by
S. Yoshida, S. Nishino, H. Harima and T. Kimoto
Pages
1133-1136
DOI
10.4028/www.scientific.net/MSF.389-393.1133
Citation
D.T. Morisette, J. A. Cooper, "Impact of Material Defects on SiC Schottky Barrier Diodes", Materials Science Forum, Vols. 389-393, pp. 1133-1136, 2002
Online since
April 2002
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Price
$32.00
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