Paper Title:
High-Power SiC Diodes: Characteristics, Reliability and Relation to Material Defects
  Abstract

  Info
Periodical
Materials Science Forum (Volumes 389-393)
Edited by
S. Yoshida, S. Nishino, H. Harima and T. Kimoto
Pages
1259-1264
DOI
10.4028/www.scientific.net/MSF.389-393.1259
Citation
H. Lendenmann, F. Dahlquist, P. Bergman, H. Bleichner, C. Hallin, "High-Power SiC Diodes: Characteristics, Reliability and Relation to Material Defects", Materials Science Forum, Vols. 389-393, pp. 1259-1264, 2002
Online since
April 2002
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Price
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