Paper Title:
Electrical Characterization of High-Voltage 4H-SiC Diodes on High-Temperature CVD-Grown Epitaxial Layers
  Abstract

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Periodical
Materials Science Forum (Volumes 389-393)
Edited by
S. Yoshida, S. Nishino, H. Harima and T. Kimoto
Pages
1285-1288
DOI
10.4028/www.scientific.net/MSF.389-393.1285
Citation
U. Zimmermann, J. Österman, J. Zhang, A. Henry, A. Hallén, "Electrical Characterization of High-Voltage 4H-SiC Diodes on High-Temperature CVD-Grown Epitaxial Layers", Materials Science Forum, Vols. 389-393, pp. 1285-1288, 2002
Online since
April 2002
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