Paper Title:
Photon Emission Analysis of Defect-Free 4H-SiC pn Diodes in Avalanche Regime
  Abstract

  Info
Periodical
Materials Science Forum (Volumes 389-393)
Edited by
S. Yoshida, S. Nishino, H. Harima and T. Kimoto
Pages
1293-1296
DOI
10.4028/www.scientific.net/MSF.389-393.1293
Citation
C. Banc, E. Bano, T. Ouisse, K. Vassilevski, K. Zekentes, "Photon Emission Analysis of Defect-Free 4H-SiC pn Diodes in Avalanche Regime", Materials Science Forum, Vols. 389-393, pp. 1293-1296, 2002
Online since
April 2002
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Price
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