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Growth of AlN Films by Hot-Wall CVD and Sublimation Techniques: Effect of Growth Cell Pressure

Journal Materials Science Forum (Volumes 389 - 393)
Volume Silicon Carbide and Related Materials 2001
Edited by S. Yoshida, S. Nishino, H. Harima and T. Kimoto
Pages 1469-1472
DOI 10.4028/www.scientific.net/MSF.389-393.1469
Citation A. Kakanakova-Georgieva et al., 2002, Materials Science Forum, 389-393, 1469
Authors A. Kakanakova-Georgieva, Urban Forsberg, Björn Magnusson, Rositza Yakimova, Erik Janzén
Keywords Aluminium Nitride (AlN), Cathodoluminescence, Energy Dispersive X-Ray Analysis, Hot-Wall CVD, Infrared Reflectance, Optical Microscopy, Sublimation
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