Paper Title:
Electrical Characterization of SiC/Si Heterostructures with Modified Interfaces
  Abstract

  Info
Periodical
Materials Science Forum (Volumes 389-393)
Edited by
S. Yoshida, S. Nishino, H. Harima and T. Kimoto
Pages
355-358
DOI
10.4028/www.scientific.net/MSF.389-393.355
Citation
C. Förster, P. M. Masri , J. Pezoldt, "Electrical Characterization of SiC/Si Heterostructures with Modified Interfaces", Materials Science Forum, Vols. 389-393, pp. 355-358, 2002
Online since
April 2002
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Price
$32.00
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