Paper Title:
Polytype Identification and Mapping in Heteroepitaxial Growth of 3C on Atomically Flat 4H-SiC Mesas Using Synchrotron White-Beam X-Ray Topography
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Periodical
Materials Science Forum (Volumes 389-393)
Edited by
S. Yoshida, S. Nishino, H. Harima and T. Kimoto
Pages
391-394
DOI
10.4028/www.scientific.net/MSF.389-393.391
Citation
M. Dudley, W. M. Vetter, X. Huang, P. G. Neudeck, J. A. Powell, "Polytype Identification and Mapping in Heteroepitaxial Growth of 3C on Atomically Flat 4H-SiC Mesas Using Synchrotron White-Beam X-Ray Topography", Materials Science Forum, Vols. 389-393, pp. 391-394, 2002
Online since
April 2002
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