Paper Title:
Structural Defects in Electrically Degraded 4H-SiC PiN Diodes
  Abstract

  Info
Periodical
Materials Science Forum (Volumes 389-393)
Edited by
S. Yoshida, S. Nishino, H. Harima and T. Kimoto
Pages
423-426
DOI
10.4028/www.scientific.net/MSF.389-393.423
Citation
P.O.Å. Persson, J.M. Molina-Aldareguia, P. Bergman, H. Jacobsson, T.O. Tuomi, W.J. Clegg, E. Janzén, L. Hultman, "Structural Defects in Electrically Degraded 4H-SiC PiN Diodes", Materials Science Forum, Vols. 389-393, pp. 423-426, 2002
Online since
April 2002
Export
Price
$32.00
Share

In order to see related information, you need to Login.

In order to see related information, you need to Login.