Paper Title:
Propagation of Current-Induced Stacking Faults and Forward Voltage Degradation in 4H-SiC PiN Diodes
  Abstract

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Periodical
Materials Science Forum (Volumes 389-393)
Edited by
S. Yoshida, S. Nishino, H. Harima and T. Kimoto
Pages
427-430
DOI
10.4028/www.scientific.net/MSF.389-393.427
Citation
R. E. Stahlbush, J. B. Fedison, S. Arthur, L.B. Rowland, J. W. Kretchmer, S. P. Wang, "Propagation of Current-Induced Stacking Faults and Forward Voltage Degradation in 4H-SiC PiN Diodes", Materials Science Forum, Vols. 389-393, pp. 427-430, 2002
Online since
April 2002
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