Paper Title:
Optical Emission Microscopy of Structural Defects in 4H-SiC PiN Diodes
  Abstract

  Info
Periodical
Materials Science Forum (Volumes 389-393)
Edited by
S. Yoshida, S. Nishino, H. Harima and T. Kimoto
Pages
431-434
DOI
10.4028/www.scientific.net/MSF.389-393.431
Citation
A. Galeckas, J. Linnros, B. Breitholtz, "Optical Emission Microscopy of Structural Defects in 4H-SiC PiN Diodes", Materials Science Forum, Vols. 389-393, pp. 431-434, 2002
Online since
April 2002
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