Paper Title:
Electronic Localization around Stacking Faults in Silicon Carbide
  Abstract

  Info
Periodical
Materials Science Forum (Volumes 389-393)
Edited by
S. Yoshida, S. Nishino, H. Harima and T. Kimoto
Pages
529-532
DOI
10.4028/www.scientific.net/MSF.389-393.529
Citation
H. Iwata, U. Lindefelt, S. Öberg, P. R. Briddon, "Electronic Localization around Stacking Faults in Silicon Carbide", Materials Science Forum, Vols. 389-393, pp. 529-532, 2002
Online since
April 2002
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Price
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