Paper Title:
Optical Characterization of Ion-Implanted 4H-SiC
  Abstract

  Info
Periodical
Materials Science Forum (Volumes 389-393)
Edited by
S. Yoshida, S. Nishino, H. Harima and T. Kimoto
Pages
647-650
DOI
10.4028/www.scientific.net/MSF.389-393.647
Citation
Z. C. Feng, F. Yan, W.Y. Chang, J. H. Zhao, J. Y. Lin, "Optical Characterization of Ion-Implanted 4H-SiC", Materials Science Forum, Vols. 389-393, pp. 647-650, 2002
Online since
April 2002
Export
Price
$32.00
Share

In order to see related information, you need to Login.

In order to see related information, you need to Login.