Paper Title:
Distribution Profile of Deep Levels in SiC Observed by Isothermal Capacitance Transient Spectroscopy
  Abstract

  Info
Periodical
Materials Science Forum (Volumes 389-393)
Edited by
S. Yoshida, S. Nishino, H. Harima and T. Kimoto
Pages
851-854
DOI
10.4028/www.scientific.net/MSF.389-393.851
Citation
M. Fujimaki, R. Ono, M. Kushibe, K. Masahara, K. Kojima, T. Shinohe, H. Okushi, K. Arai, "Distribution Profile of Deep Levels in SiC Observed by Isothermal Capacitance Transient Spectroscopy", Materials Science Forum, Vols. 389-393, pp. 851-854, 2002
Online since
April 2002
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