Growth and Evaluation of High Quality SiC Crystal by Sublimation Method |
| Journal |
Materials Science Forum (Volumes 389 - 393) |
| Volume |
Silicon Carbide and Related Materials 2001 |
| Edited by |
S. Yoshida, S. Nishino, H. Harima and T. Kimoto |
| Pages |
87-90 |
| DOI |
10.4028/www.scientific.net/MSF.389-393.87 |
| Citation |
Naoki Oyanagi et al., 2002, Materials Science Forum, 389-393, 87 |
| Authors |
Naoki Oyanagi, Hirotaka Yamaguchi, Tomohisa Kato, Shinichi Nishizawa, Kazuo Arai |
| Keywords |
Etch Pits, Polarizing Microscope, Section Topography, Sublimation Method, Synchrotron Radiation (XRD), X-Ray Topography |
| Full Paper |
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