Paper Title:
Effects of Interfacial Reactions on Electrical Properties of Ni Ohmic Contacts on n-Type 4H-SiC
  Abstract

  Info
Periodical
Materials Science Forum (Volumes 389-393)
Edited by
S. Yoshida, S. Nishino, H. Harima and T. Kimoto
Pages
897-900
DOI
10.4028/www.scientific.net/MSF.389-393.897
Citation
S. Y. Han, N. K. Kim, E. D. Kim, J. L. Lee, "Effects of Interfacial Reactions on Electrical Properties of Ni Ohmic Contacts on n-Type 4H-SiC", Materials Science Forum, Vols. 389-393, pp. 897-900, 2002
Online since
April 2002
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Price
$35.00
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