Characterisation and Defects in Silicon Carbide |
| Journal |
Materials Science Forum (Volumes 389 - 393) |
| Volume |
Silicon Carbide and Related Materials 2001 |
| Edited by |
S. Yoshida, S. Nishino, H. Harima and T. Kimoto |
| Pages |
9-14 |
| DOI |
10.4028/www.scientific.net/MSF.389-393.9 |
| Citation |
Peder Bergman et al., 2002, Materials Science Forum, 389-393, 9 |
| Authors |
Peder Bergman, H. Jakobsson, L. Storasta, F.H.C. Carlsson, Björn Magnusson, S.G. Sridhara, G.R. Pozina, H. Lendenmann, Erik Janzén |
| Keywords |
Carrier Lifetime, Defect, Dislocations, Stacking Fault |
| Full Paper |
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