Paper Title:
Dislocation Microstructures Identification by X-Ray Diffraction-Line Broadening Analysis
  Abstract

  Info
Periodical
Materials Science Forum (Volumes 404-407)
Edited by
A.M. Dias, J. Pina, A.C. Batista and E. Diogo
Pages
133-140
DOI
10.4028/www.scientific.net/MSF.404-407.133
Citation
H. Bougrab, K. Inal, M. Berveiller, "Dislocation Microstructures Identification by X-Ray Diffraction-Line Broadening Analysis", Materials Science Forum, Vols. 404-407, pp. 133-140, 2002
Online since
August 2002
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Price
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