Global X-Ray Method for the Determination of Stress Profiles |
|
| Journal | Materials Science Forum (Volumes 404 - 407) |
|---|---|
| Volume | Residual Stresses VI, ECRS6 |
| Edited by | A.M. Dias, J. Pina, A.C. Batista and E. Diogo |
| Pages | 19-24 |
| DOI | 10.4028/www.scientific.net/MSF.404-407.19 |
| Authors | Jean Michel Sprauel, H. Michaud |
| Keywords | Four-Point Bending, Shot Peening, Stress Profile, X-Rays |
| Full Paper | 
Get the full paper by clicking here
|