Paper Title:
Analysis of Depth Profiles of Residual Stress Using Synchrotron Radiation
  Abstract

  Info
Periodical
Materials Science Forum (Volumes 404-407)
Edited by
A.M. Dias, J. Pina, A.C. Batista and E. Diogo
Pages
293-298
DOI
10.4028/www.scientific.net/MSF.404-407.293
Citation
K. Akita, K. Kubota, Y. Yoshioka, H. Suzuki, "Analysis of Depth Profiles of Residual Stress Using Synchrotron Radiation", Materials Science Forum, Vols. 404-407, pp. 293-298, 2002
Online since
August 2002
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Price
$32.00
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