Assumptions in Thin Film Residual Stress Methods |
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| Journal | Materials Science Forum (Volumes 404 - 407) |
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| Volume | Residual Stresses VI, ECRS6 |
| Edited by | A.M. Dias, J. Pina, A.C. Batista and E. Diogo |
| Pages | 35-42 |
| DOI | 10.4028/www.scientific.net/MSF.404-407.35 |
| Authors | Arnold C. Vermeulen |
| Keywords | Assumption Analysis, g(ψ) Method, Stress Method, Thin Film, X-Ray Diffraction (XRD) |
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