Paper Title:
X-Ray Diffraction Residual Stress Measurement Reliability: Stressed Reference Samples
  Abstract

  Info
Periodical
Materials Science Forum (Volumes 404-407)
Edited by
A.M. Dias, J. Pina, A.C. Batista and E. Diogo
Pages
573-578
DOI
10.4028/www.scientific.net/MSF.404-407.573
Citation
C. Ferreira, M. François, R. Guillén, "X-Ray Diffraction Residual Stress Measurement Reliability: Stressed Reference Samples", Materials Science Forum, Vols. 404-407, pp. 573-578, 2002
Online since
August 2002
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Price
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