Paper Title:
Evaluation of Growth and Thermal Strains/Stresses in Epitaxial Thin Films Using X-Ray Diffraction
  Abstract

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Periodical
Materials Science Forum (Volumes 404-407)
Edited by
A.M. Dias, J. Pina, A.C. Batista and E. Diogo
Pages
697-702
DOI
10.4028/www.scientific.net/MSF.404-407.697
Citation
J. Keckes, "Evaluation of Growth and Thermal Strains/Stresses in Epitaxial Thin Films Using X-Ray Diffraction", Materials Science Forum, Vols. 404-407, pp. 697-702, 2002
Online since
August 2002
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