Paper Title:
Elastic Constant Measurement in Supported W/Cu Multilayer Thin Films by X-Ray Diffraction
  Abstract

  Info
Periodical
Materials Science Forum (Volumes 404-407)
Edited by
A.M. Dias, J. Pina, A.C. Batista and E. Diogo
Pages
791-796
DOI
10.4028/www.scientific.net/MSF.404-407.791
Citation
P. Villain, P. Goudeau, P. O. Renault, K.F. Badawi, "Elastic Constant Measurement in Supported W/Cu Multilayer Thin Films by X-Ray Diffraction", Materials Science Forum, Vols. 404-407, pp. 791-796, 2002
Online since
August 2002
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