Paper Title:
Measurement of Stress in Phosphated-Iron Oxide Layers by In-Situ Diffraction of Synchrotron Radiation
  Abstract

  Info
Periodical
Materials Science Forum (Volumes 404-407)
Edited by
A.M. Dias, J. Pina, A.C. Batista and E. Diogo
Pages
809-816
DOI
10.4028/www.scientific.net/MSF.404-407.809
Citation
B. Panicaud, P. O. Renault, J. L. Grosseau-Poussard, J.F. Dinhut, D. Thiaudière, M. Gailhanou, "Measurement of Stress in Phosphated-Iron Oxide Layers by In-Situ Diffraction of Synchrotron Radiation", Materials Science Forum, Vols. 404-407, pp. 809-816, 2002
Online since
August 2002
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