Paper Title:
Texture Analysis of Ferroelectric Thin Films on Platinised Si-Based Substrates with a TiO2 Layer
  Abstract

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Periodical
Materials Science Forum (Volumes 408-412)
Edited by
Dong Nyung Lee
Pages
1543-1548
DOI
10.4028/www.scientific.net/MSF.408-412.1543
Citation
J. Ricote, M. Morales, M.L. Calzada, "Texture Analysis of Ferroelectric Thin Films on Platinised Si-Based Substrates with a TiO2 Layer", Materials Science Forum, Vols. 408-412, pp. 1543-1548, 2002
Online since
August 2002
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