Paper Title:
Rietveld Texture and Stress Analysis of Thin Films by X-Ray Diffraction
  Abstract

  Info
Periodical
Materials Science Forum (Volumes 408-412)
Edited by
Dong Nyung Lee
Pages
1603-1608
DOI
10.4028/www.scientific.net/MSF.408-412.1603
Citation
L. Lutterotti, S. Matthies, D. Chateigner, S. Ferrari, J. Ricote, "Rietveld Texture and Stress Analysis of Thin Films by X-Ray Diffraction", Materials Science Forum, Vols. 408-412, pp. 1603-1608, 2002
Online since
August 2002
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Price
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