Paper Title:
Quantitative Texture Analysis with Hard (100 keV) Synchrotron X-Rays
  Abstract

  Info
Periodical
Materials Science Forum (Volumes 408-412)
Edited by
Dong Nyung Lee
Pages
167-172
DOI
10.4028/www.scientific.net/MSF.408-412.167
Citation
L. Wcislak, H. Klein, H. J. Bunge, U. Garbe, J.R. Schneider, "Quantitative Texture Analysis with Hard (100 keV) Synchrotron X-Rays", Materials Science Forum, Vols. 408-412, pp. 167-172, 2002
Online since
August 2002
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Price
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